Scanning probe microscope

Definition

A scanning probe microscope (SPM) is a device that uses a physical probe to scan the surface of a specimen at the atomic level. It provides high-resolution imaging and can also manipulate surfaces at the nanoscale.

5 Must Know Facts For Your Next Test

1. There are different types of SPM, including Atomic Force Microscopy (AFM) and Scanning Tunneling Microscopy (STM).
2. SPMs utilize a sharp probe that interacts with the sample surface to produce images.
3. They can achieve resolutions down to fractions of a nanometer.
4. SPMs can be used to study both conductive and non-conductive samples.
5. These microscopes are essential for visualizing structures that are smaller than what optical microscopes can resolve.

Related terms

Atomic Force Microscopy (AFM): A type of SPM that measures forces between the probe and sample surface to generate images.

Scanning Tunneling Microscopy (STM): A type of SPM that uses tunneling current between the tip and sample to produce atomic-scale images.

Resolution:

The ability of a microscope to distinguish two close points as separate; critical for high-detail imaging.