Atomic force microscope

Definition

An atomic force microscope (AFM) is a high-resolution type of scanning probe microscope with a resolution on the order of fractions of a nanometer. It is used to image, measure, and manipulate matter at the nanoscale.

5 Must Know Facts For Your Next Test

1. AFM can generate images at the atomic level without requiring sample staining or coating.
2. It uses a cantilever with a sharp tip to scan the surface of the specimen.
3. AFM operates in several modes including contact mode, tapping mode, and non-contact mode.
4. The deflection of the cantilever is measured using a laser beam reflected off its surface onto a photodetector.
5. AFM can be used to study both biological specimens like cells and proteins as well as inorganic materials.

Related terms

Scanning Electron Microscope (SEM):

A type of electron microscope that produces images by scanning the surface with a focused beam of electrons.

Scanning Tunneling Microscope (STM):

A microscope that uses quantum tunneling to generate high-resolution images of surfaces at the atomic level.

Confocal Laser Scanning Microscope (CLSM): A fluorescence imaging technique that increases optical resolution and contrast by using point illumination and spatial pinhole detection.