Optoelectronics
Atomic force microscopy (AFM) is a powerful imaging technique that allows researchers to visualize surfaces at the nanoscale by measuring the forces between a sharp probe and the surface being studied. This method enables the examination of material properties, such as roughness and mechanical characteristics, making it crucial in semiconductor growth techniques where precise control over material properties is necessary. By providing high-resolution images, AFM helps scientists understand the structure and morphology of semiconductor materials, which is essential for improving the performance of electronic devices.
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