Nanoelectronics and Nanofabrication
X-ray photoelectron spectroscopy (XPS) is an analytical technique used to determine the elemental composition and chemical state of materials by measuring the kinetic energy of photoelectrons ejected from a sample when irradiated with X-rays. This method provides valuable information about the surface chemistry of materials, making it particularly useful in characterizing nanostructures like quantum dots, as it reveals insights into their electronic properties and chemical environments.
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