Mathematical Crystallography
Analysis of epitaxial layers involves studying the arrangement and properties of crystalline layers that are grown on a substrate, which is crucial for understanding their structural and electronic characteristics. This process helps in assessing the quality, thickness, and orientation of the layers, enabling researchers to tailor material properties for applications in electronics and optoelectronics. Specialized diffraction methods are often employed in this analysis to gain detailed insights into the crystallography of the layers.
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