Small-angle x-ray scattering (SAXS) is a powerful analytical technique used to study the structural properties of materials at the nanoscale by measuring the scattering of x-rays at very low angles. It provides insights into the size, shape, and distribution of nanoparticles and other nanostructures, which are critical for advancing nanotechnology in various fields, including additive manufacturing. SAXS is particularly valuable because it allows researchers to analyze complex structures in a non-destructive manner, revealing information that can influence material design and performance.
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