Inorganic Chemistry II
Scanning Electron Microscopy (SEM) is a powerful imaging technique that uses focused beams of electrons to scan the surface of a sample, creating high-resolution images with detailed topographical and compositional information. This technique is particularly valuable for studying nanomaterials, as it provides insights into their morphology, structure, and surface properties at the nanoscale, which is essential for understanding their behavior and applications in various fields.
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