Thermoelectric Materials and Devices
Scanning Electron Microscopy (SEM) is a powerful imaging technique that uses focused beams of electrons to scan the surface of a sample, providing high-resolution, three-dimensional images of its morphology and composition. This method is crucial for analyzing materials at the micro and nanoscale, enabling detailed insights into nanostructure fabrication processes, thin film characteristics, thermoelectric sensor integration, and the study of novel materials for thermoelectrics.
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