Spectroscopy
X-ray fluorescence spectroscopy (XRF) is an analytical technique used to determine the elemental composition of materials by detecting the characteristic X-rays emitted from a sample when it is excited by an X-ray source. This technique allows for non-destructive analysis, making it particularly useful in various scientific fields, including material science and inorganic chemistry, where understanding elemental composition is crucial for characterizing materials and studying their properties.
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