Spectroscopy
X-ray diffraction is a technique used to study the structure of crystalline materials by directing X-rays at a sample and measuring the angles and intensities of the scattered X-rays. This method relies on the wave nature of X-rays, which are a part of the electromagnetic spectrum, to reveal information about the arrangement of atoms within a crystal lattice. The resulting diffraction pattern provides insights that are crucial for understanding material properties, which is essential in various scientific fields.
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