Solid-State Battery Technology
Synchrotron-based X-ray diffraction (XRD) is a powerful structural characterization technique that utilizes high-intensity X-rays generated by a synchrotron radiation source. This method offers enhanced resolution and sensitivity compared to conventional XRD, making it particularly useful for analyzing the crystalline structures of materials at the atomic level. The ability to tune the wavelength of the X-rays and achieve high brilliance allows for detailed studies of complex materials, including thin films and nanostructures.
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