Manhattan distance is a measure of distance between two points in a grid-based system, calculated by taking the sum of the absolute differences of their Cartesian coordinates. This metric is particularly useful in hierarchical tree diagrams and dendrograms, as it provides a way to quantify the dissimilarity between data points, ultimately aiding in the clustering process. By using this distance metric, visual representations of data relationships become clearer, allowing for better interpretation of groupings and hierarchies.
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