Crystallography
Wilson plots are graphical representations used in crystallography to assess the quality of X-ray diffraction data by plotting the logarithm of the intensity of diffracted X-rays against the sine of half the scattering angle. This plot helps to identify systematic errors in data collection and can assist in estimating the completeness and redundancy of the collected data. By analyzing the slope and intercept of the plot, researchers can also gain insights into the overall quality of the crystal and the effectiveness of data reduction techniques.
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