Chemical Kinetics
Atomic Force Microscopy (AFM) is a high-resolution imaging technique that utilizes a tiny probe to scan the surface of a sample at the atomic level. This technique provides detailed topographical information and allows for the study of various properties, such as mechanical, electrical, and magnetic characteristics of materials. AFM is particularly valuable in single-molecule kinetics, as it can capture real-time interactions and dynamics at the nanoscale, enabling researchers to observe molecular behaviors that traditional microscopy methods cannot.
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